Diffraction studies under in situ electric field using a large-area hybrid pixel XPAD detector - Archive ouverte HAL
Article Dans Une Revue Journal of Applied Crystallography Année : 2013

Diffraction studies under in situ electric field using a large-area hybrid pixel XPAD detector

Dates et versions

hal-01954768 , version 1 (13-12-2018)

Identifiants

Citer

Pierre Fertey, Paul Alle, Emmanuel Wenger, Bernard Dinkespiler, Olivier Cambon, et al.. Diffraction studies under in situ electric field using a large-area hybrid pixel XPAD detector. Journal of Applied Crystallography, 2013, 46 (4), pp.1151-1161. ⟨10.1107/S0021889813013903⟩. ⟨hal-01954768⟩
170 Consultations
0 Téléchargements

Altmetric

Partager

More