Numerical analysis based on localized multigrid X-FEM of 3D crack pattern formation during the scratching of a polymer - Archive ouverte HAL Access content directly
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Numerical analysis based on localized multigrid X-FEM of 3D crack pattern formation during the scratching of a polymer

Rannou J
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Schirrer R
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hal-01952482 , version 1 (12-12-2018)

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  • HAL Id : hal-01952482 , version 1

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Marie-Christine Baietto, Rannou J, Anthony Gravouil, H Pelletier, Christian Gauthier, et al.. Numerical analysis based on localized multigrid X-FEM of 3D crack pattern formation during the scratching of a polymer. World Tribology Congress 2009, Sep 2009, Kyoto, Japan. ⟨hal-01952482⟩
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