Low Dose and Low Dose rate measurements of X-rays using Copper-doped Sol-gel Silica Glass - Archive ouverte HAL Access content directly
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Low Dose and Low Dose rate measurements of X-rays using Copper-doped Sol-gel Silica Glass

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hal-01935495 , version 1 (26-11-2018)

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  • HAL Id : hal-01935495 , version 1

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Nissrine Al Helou, Hicham El Hamzaoui, Bruno Capoen, Geraud Bouwmans, Andy Cassez, et al.. Low Dose and Low Dose rate measurements of X-rays using Copper-doped Sol-gel Silica Glass. THE 12th INTERNATIONAL SYMPOSIUM ON SiO2, ADVANCED DIELECTRICS AND RELATED DEVICES, Jun 2018, Bari, Italy. ⟨hal-01935495⟩
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