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Article Dans Une Revue IOP Conference Series: Materials Science and Engineering Année : 2010

The investigation of boron-doped silicon using atom probe tomography

D Blavette
Emmanuel Cadel
O Cojocaru-Mirédin
  • Fonction : Auteur
Bernard Deconihout

Dates et versions

hal-01929142 , version 1 (21-11-2018)

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D Blavette, Emmanuel Cadel, O Cojocaru-Mirédin, Bernard Deconihout. The investigation of boron-doped silicon using atom probe tomography. IOP Conference Series: Materials Science and Engineering, 2010, 7, pp.012004. ⟨10.1088/1757-899X/7/1/012004⟩. ⟨hal-01929142⟩
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