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Article Dans Une Revue IEEE Transactions on Components, Packaging and Manufacturing Technology Année : 2012

Crystallographic Characterization of an Electroplated Zinc Coating Prone to Whiskers

Auriane Etienne
Emmanuel Cadel
Agnès Lina
  • Fonction : Auteur
Laurent Cretinon
  • Fonction : Auteur
Philippe Pareige

Résumé

A Zn-electroplated steel prone to Zn whiskers has been investigated in order to obtain information about the microstructure of the Zn coating at the root of a whisker. Indeed, the characterization of the Zn coating is essential to understand the Zn whisker growth mechanism. Care was taken to prepare a sample at a whisker root by using a focused-ion beam in a dual-beam scanning electron microscope. The sample was analyzed using energy dispersive X-ray spectrometry and electron backscattered diffraction. Results show three different regions: 1) an inclusion enriched with Ca, Al, and C; 2) the Zn coating with columnar grains; and 3) the root of the whisker. An important point is that recrystallized grains are found at the whisker root. This observation supports recent whisker growth models based on recrystallization.
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Dates et versions

hal-01929141 , version 1 (02-12-2022)

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Auriane Etienne, Emmanuel Cadel, Agnès Lina, Laurent Cretinon, Philippe Pareige. Crystallographic Characterization of an Electroplated Zinc Coating Prone to Whiskers. IEEE Transactions on Components, Packaging and Manufacturing Technology, 2012, 2 (11), pp.1928--1932. ⟨10.1109/TCPMT.2012.2203134⟩. ⟨hal-01929141⟩
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