We report the realization of a Tamm plasmon resonance in a planar structure by deposition of a gold film on a one-dimensional photonic crystal made of mesoporous silicon. The observation of a dip in the reflectance as well as a singularity in the ellipsometric angles confirms the presence of Tamm plasmon-polaritons with a higher quality factor than previously reported for porous Tamm structures. The simple electrochemical fabrication process of the porous silicon multilayer has the potential to facilitate the advent of integrated Tamm sensors by allowing an analyte to diffuse to the region where the electromagnetic field enhancement is highest while being low-cost and potentially CMOS-compatible.