La2Zr2−xCexO7 buffer layers are synthesized by chemical solution deposition on Ni–5%W RABIT substrate. Their structure and microstructure are examined as a function of cerium ratio by x-ray diffraction, atomic force microscopy and electron backscattering diffraction techniques. The composition La2Zr1.9Ce0.1O7 is a very promising candidate as buffer layer for coated conductor tapes. Indeed this Ce-doped layer shows a lower structural mismatch with YBa2Cu3O7−δ, a better texture quality and a smother surface than the classic La2Zr2O7 buffer layer. As a conclusion, this layer presents a high potential to yield a high Jc value in YBa2Cu3O7−δ tapes.