Optical in-situ measurement of tapered optical fibers with nanometric resolution
Résumé
We propose and demonstrate a procedure to measure the profile of tapered fibers with an accuracy of a few nanometers. It can be implemented on any optical microscope. Only based on a computer analysis of the microscope images, this fast and reliable technique does not require any change on the microscope.
| Origine | Fichiers produits par l'(les) auteur(s) |
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