A body built-in cell for detecting transient faults and dynamically biasing subcircuits of integrated systems - Archive ouverte HAL
Article Dans Une Revue Microelectronics Reliability Année : 2018
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hal-01893707 , version 1 (11-10-2018)

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Thiago Ferreira de Paiva Leite, Laurent Fesquet, Rodrigo Possamai Bastos. A body built-in cell for detecting transient faults and dynamically biasing subcircuits of integrated systems. Microelectronics Reliability, 2018, 88-90, pp.122-127. ⟨10.1016/j.microrel.2018.07.069⟩. ⟨hal-01893707⟩

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