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Article Dans Une Revue IEEE Transactions on Instrumentation and Measurement Année : 2004

Time-Resolved Scanning of Integrated Circuits With a Pulsed Laser: Application to Transient Fault Injection in an ADC

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hal-01887656 , version 1 (04-10-2018)

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V. Pouget, D. Lewis, P. Fouillat. Time-Resolved Scanning of Integrated Circuits With a Pulsed Laser: Application to Transient Fault Injection in an ADC. IEEE Transactions on Instrumentation and Measurement, 2004, 53 (4), pp.1227 - 1231. ⟨10.1109/TIM.2004.831488⟩. ⟨hal-01887656⟩
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