Journal Articles
IEEE Transactions on Instrumentation and Measurement
Year : 2004
Vincent Pouget : Connect in order to contact the contributor
https://hal.science/hal-01887656
Submitted on : Thursday, October 4, 2018-12:12:46 PM
Last modification on : Friday, March 24, 2023-2:53:08 PM
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V. Pouget, D. Lewis, P. Fouillat. Time-Resolved Scanning of Integrated Circuits With a Pulsed Laser: Application to Transient Fault Injection in an ADC. IEEE Transactions on Instrumentation and Measurement, 2004, 53 (4), pp.1227 - 1231. ⟨10.1109/TIM.2004.831488⟩. ⟨hal-01887656⟩
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