From Static Thermal and Photoelectric Laser Stimulation (TLS/PLS) to Dynamic Laser Testing - Archive ouverte HAL Access content directly
Journal Articles Microelectronics Reliability Year : 2003

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hal-01887652 , version 1 (04-10-2018)

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F. Beaudoin, R. Desplats, P. Perdu, Abdellatif Firiti, G. Haller, et al.. From Static Thermal and Photoelectric Laser Stimulation (TLS/PLS) to Dynamic Laser Testing. Microelectronics Reliability, 2003, 43 (9-11), pp.1681 - 1686. ⟨10.1016/S0026-2714(03)00305-6⟩. ⟨hal-01887652⟩
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