Journal Articles
Microelectronics Reliability
Year : 2003
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https://hal.science/hal-01887652
Submitted on : Thursday, October 4, 2018-12:06:29 PM
Last modification on : Friday, March 24, 2023-2:53:08 PM
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- HAL Id : hal-01887652 , version 1
- DOI : 10.1016/S0026-2714(03)00305-6
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F. Beaudoin, R. Desplats, P. Perdu, Abdellatif Firiti, G. Haller, et al.. From Static Thermal and Photoelectric Laser Stimulation (TLS/PLS) to Dynamic Laser Testing. Microelectronics Reliability, 2003, 43 (9-11), pp.1681 - 1686. ⟨10.1016/S0026-2714(03)00305-6⟩. ⟨hal-01887652⟩
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