Correlated evolution of structure and mechanical loss of a sputtered silica film - Archive ouverte HAL
Article Dans Une Revue Phys.Rev.Mater. Année : 2018

Correlated evolution of structure and mechanical loss of a sputtered silica film

Résumé

Energy dissipation in amorphous coatings severely affects high-precision optical and quantum transducers. In order to isolate the source of coating loss, we performed an extensive study of Raman scattering and mechanical loss of a thermally treated sputtered silica coating. Our results show that loss is correlated with the population of three-membered rings of Si- O 4 tetrahedral units and support the evidence that thermal treatment reduces the density of metastable states separated by a characteristic energy of about 0.5 eV in favor of an increase of the density of states separated by smaller activation energies.
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Dates et versions

hal-01881003 , version 1 (10-01-2024)

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Massimo Granata, Elodie Coillet, Valérie Martinez, Vincent Dolique, Alex Amato, et al.. Correlated evolution of structure and mechanical loss of a sputtered silica film. Phys.Rev.Mater., 2018, 2 (05), pp.053607. ⟨10.1103/PhysRevMaterials.2.053607⟩. ⟨hal-01881003⟩
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