Correlated evolution of structure and mechanical loss of a sputtered silica film - Archive ouverte HAL
Article Dans Une Revue Phys.Rev.Mater. Année : 2018

Correlated evolution of structure and mechanical loss of a sputtered silica film

Résumé

Energy dissipation in amorphous coatings severely affects high-precision optical and quantum transducers. In order to isolate the source of coating loss, we performed an extensive study of Raman scattering and mechanical loss of a thermally treated sputtered silica coating. Our results show that loss is correlated with the population of three-membered rings of Si- O 4 tetrahedral units and support the evidence that thermal treatment reduces the density of metastable states separated by a characteristic energy of about 0.5 eV in favor of an increase of the density of states separated by smaller activation energies.
Fichier principal
Vignette du fichier
1706.02928.pdf (237.28 Ko) Télécharger le fichier
Origine Fichiers éditeurs autorisés sur une archive ouverte

Dates et versions

hal-01881003 , version 1 (10-01-2024)

Identifiants

Citer

Massimo Granata, Elodie Coillet, Valérie Martinez, Vincent Dolique, Alex Amato, et al.. Correlated evolution of structure and mechanical loss of a sputtered silica film. Phys.Rev.Mater., 2018, 2 (05), pp.053607. ⟨10.1103/PhysRevMaterials.2.053607⟩. ⟨hal-01881003⟩
154 Consultations
37 Téléchargements

Altmetric

Partager

More