Comprehensive description of the electro-optic effects in strained silicon waveguides - Archive ouverte HAL Access content directly
Journal Articles Journal of Applied Physics Year : 2017

Comprehensive description of the electro-optic effects in strained silicon waveguides

Abstract

We present a novel and comprehensive analysis method that considers both plasma-dispersion effect and the strain-induced Pockels effect to faithfully describe the electro-optic effects taking place in a strained silicon waveguide under an applied voltage. The change of carrier distribution arising from the application of a voltage, leads to a redistribution of the electrostatic field which deeply affects the strain-induced Pockels effect. By simulating the strain gradients distribution inside the waveguide together with the free carrier concentration in silicon, we were able to describe that the effective index change due to Pockels effect in strained silicon waveguides and the applied voltage have a nonlinear relationship.
Fichier principal
Vignette du fichier
Comprehensive_description_of_EO_effects_in_strained_silicon_waveguides.pdf (1.18 Mo) Télécharger le fichier
Origin : Files produced by the author(s)
Loading...

Dates and versions

hal-01878844 , version 1 (21-09-2018)

Identifiers

Cite

Pedro Damas, Mathias Berciano, Guillaume Marcaud, Carlos Alonso Ramos, Delphine Marris-Morini, et al.. Comprehensive description of the electro-optic effects in strained silicon waveguides. Journal of Applied Physics, 2017, 122 (15), ⟨10.1063/1.4985836⟩. ⟨hal-01878844⟩
34 View
214 Download

Altmetric

Share

Gmail Facebook Twitter LinkedIn More