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Article Dans Une Revue physica status solidi (a) Année : 2014

Interfacial abruptness in axial Si/SiGe heterostructures in nanowires probed by scanning capacitance microscopy

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Chimie

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hal-01869723 , version 1 (06-09-2018)

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Laurence Latu-Romain, P. Periwal, F. Bassani, G. Patriarche, V. Brouzet, et al.. Interfacial abruptness in axial Si/SiGe heterostructures in nanowires probed by scanning capacitance microscopy. physica status solidi (a), 2014, 211 (2), pp.509 - 513. ⟨10.1002/pssa.201300208⟩. ⟨hal-01869723⟩
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