Article Dans Une Revue Applied Physics Letters Année : 2016

Charge multiplication effect in thin diamond films

Résumé

Herein, we report on the enhanced sensitivity for the detection of charged particles in single crystal chemical vapour deposition (scCVD) diamond radiation detectors. The experimental results demonstrate charge multiplication in thin planar diamond membrane detectors, upon impact of 18MeV O ions, under high electric field conditions. Avalanche multiplication is widely exploited in devices such as avalanche photo diodes, but has never before been reproducibly observed in intrinsic CVD diamond. Because enhanced sensitivity for charged particle detection is obtained for short charge drift lengths without dark counts, this effect could be further exploited in the development of sensors based on avalanche multiplication and radiation detectors with extreme radiation hardness.

Fichier principal
Vignette du fichier
article_NSkukan.pdf (578.54 Ko) Télécharger le fichier
Origine Fichiers produits par l'(les) auteur(s)
Licence

Dates et versions

hal-01869601 , version 1 (27-06-2023)

Licence

Identifiants

Citer

N. Skukan, V. Grilj, I. Sudić, Michal Pomorski, W. Kada, et al.. Charge multiplication effect in thin diamond films. Applied Physics Letters, 2016, 109 (4), pp.043502. ⟨10.1063/1.4959863⟩. ⟨hal-01869601⟩
209 Consultations
247 Téléchargements

Altmetric

Partager

  • More