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Communication Dans Un Congrès Année : 2012

Non-ionizing energy loss: an additional wear-out mechanism in latent reliability degradation

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Electronique
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hal-01824359 , version 1 (27-06-2018)

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  • HAL Id : hal-01824359 , version 1

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M. Naceur, A. Privat, Antoine Touboul, J.-R. Vaillé, E. Lorfèvre, et al.. Non-ionizing energy loss: an additional wear-out mechanism in latent reliability degradation. IEEE RADECS 2012, 2012, Biarritz, France. ⟨hal-01824359⟩
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