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Communication Dans Un Congrès Année : 2010

Localized Irradiation of a Microcircuit using a Scanning Electron Microscope for Observation of Circuit Effects

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Electronique
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Dates et versions

hal-01823524 , version 1 (26-06-2018)

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  • HAL Id : hal-01823524 , version 1

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Y. Gonzalez Velo, J. Boch, F. Pichot, J. Mekki, N. Roche, et al.. Localized Irradiation of a Microcircuit using a Scanning Electron Microscope for Observation of Circuit Effects. 47th IEEE Nuclear Space and Radiation Effects Conference, 2010, Denver, United States. ⟨hal-01823524⟩
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