Study of the Contribution of Latent Defects Induced by Swift Heavy Ion Irradiation on the Gate Oxide Breakdown - Archive ouverte HAL
Communication Dans Un Congrès Année : 2008

Study of the Contribution of Latent Defects Induced by Swift Heavy Ion Irradiation on the Gate Oxide Breakdown

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Electronique
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Dates et versions

hal-01822746 , version 1 (25-06-2018)

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  • HAL Id : hal-01822746 , version 1

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M. Marinoni, Antoine Touboul, D. Zander, C. Petit, A.M.J.F. Carvalho, et al.. Study of the Contribution of Latent Defects Induced by Swift Heavy Ion Irradiation on the Gate Oxide Breakdown. 7th European Workshop on Radiation and its Effects on Components and Systems, 2008, Jyvaskyla, Finland. ⟨hal-01822746⟩
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