0.65Pb(Mg 1/3 Nb 2/3 )O 3 –0.35PbTiO 3 Thick Films for High-Frequency Piezoelectric Transducer Applications - Archive ouverte HAL
Article Dans Une Revue Japanese Journal of Applied Physics Année : 2013

0.65Pb(Mg 1/3 Nb 2/3 )O 3 –0.35PbTiO 3 Thick Films for High-Frequency Piezoelectric Transducer Applications

Résumé

The properties of 0.65Pb(Mg 1/3 Nb 2/3 )O 3 –0.35PbTiO 3 (0.65PMN–0.35PT) thick films were studied for high-frequency piezoelectric transducer applications. The films were prepared by screen-printing a thick-film paste on platinized alumina substrates and subsequent sintering at 950 °C. The effective thickness-coupling factor of these films was close to 48%, which is comparable with bulk ceramics having the same compositions. Furthermore, simulations of two configurations representing one element of a high-frequency linear-array transducer (30 MHz) suggests that 0.65PMN–0.35PT thick-films in 50 Ω electrical matching environment improves the performance in comparison with standard Pb(Zr,Ti)O 3 (PZT) compositions.
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Dates et versions

hal-01814884 , version 1 (13-06-2018)

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Hana Ursic, Franck Levassort, Janez Holc, Marc Lethiecq, Marija Kosec. 0.65Pb(Mg 1/3 Nb 2/3 )O 3 –0.35PbTiO 3 Thick Films for High-Frequency Piezoelectric Transducer Applications. Japanese Journal of Applied Physics, 2013, 52 (5R), pp.055502. ⟨10.7567/JJAP.52.055502⟩. ⟨hal-01814884⟩
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