Optical measurement of exposure depth and refractive index in positive photoresists - Archive ouverte HAL
Article Dans Une Revue Optics Communications Année : 2013

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hal-01810801 , version 1 (08-06-2018)

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Thomas Wood, Vincent Brissonneau, Jean-Baptiste Brueckner, Gerard Berginc, François Flory, et al.. Optical measurement of exposure depth and refractive index in positive photoresists. Optics Communications, 2013, 291, pp.184-192. ⟨10.1016/j.optcom.2012.10.062⟩. ⟨hal-01810801⟩
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