Estimation of Low-Dose-Rate Degradation on Bipolar Linear Integrated Circuits Using Switching Experiments - Archive ouverte HAL
Communication Dans Un Congrès Année : 2005

Estimation of Low-Dose-Rate Degradation on Bipolar Linear Integrated Circuits Using Switching Experiments

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Electronique
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hal-01807152 , version 1 (04-06-2018)

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  • HAL Id : hal-01807152 , version 1

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Jérôme Boch, Frédéric Saigné, R.D. Schrimpf, J.-R. Vaillé, L. Dusseau, et al.. Estimation of Low-Dose-Rate Degradation on Bipolar Linear Integrated Circuits Using Switching Experiments. 42th IEEE Nuclear Space and Radiation Effects Conference, 2005, Seattle, United States. ⟨hal-01807152⟩
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