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                <term xml:lang="fr">détection de plan</term>
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              <p>Etant données deux vues d'une même scène, les techniques classiques de mise en correspondance géométrique s'appuient généralement sur l'efficacité maintes fois démontrée des descripteurs de points d'intérêt. Cependant, de tels indices sont mis en difficulté dans des environnements peu texturés, contenant possiblement des structures répétées et/ou des spécularités, comme les environnements industriels. Dans ce papier, nous proposons une nouvelle méthode pour l'estimation des géométries épipolaire et planaire entre deux vues, qui vise tout d'abord à détecter et mettre en correspondance les plans verticaux souvent présents dans ces environnements, avant d'estimer les homographies correspondantes. Les correspondances locales ainsi générées sont ensuite utilisées pour améliorer l'estimation de la matrice fondamentale. Le gain en précision a été démontré sur des images d'environnements industriel et urbain.</p>
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