Optical Contactless Measurement of Electric Field-Induced Tensile Stress in Diamond Nanoscale Needles - Archive ouverte HAL
Article Dans Une Revue Nano Letters Année : 2017

Optical Contactless Measurement of Electric Field-Induced Tensile Stress in Diamond Nanoscale Needles

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hal-01766100 , version 1 (13-04-2018)

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Lorenzo Rigutti, Linda Venturi, Jonathan Houard, Antoine Normand, Elena Silaeva, et al.. Optical Contactless Measurement of Electric Field-Induced Tensile Stress in Diamond Nanoscale Needles. Nano Letters, 2017, 17 (12), pp.7401 - 7409. ⟨10.1021/acs.nanolett.7b03222⟩. ⟨hal-01766100⟩
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