The AFM and Raman Study of Few Layer Graphene - Archive ouverte HAL
Communication Dans Un Congrès Année : 2017

The AFM and Raman Study of Few Layer Graphene

In this paper, the synthesis process an characterizations of self organized graphene layers are discussed. The Atomic force microscopy (AFM) and Raman spectroscopy is used to study surface and structural properties of obtained layers. Cross sectional and histogram analysis are used to describe obtained AFM images. The relationship between typical Raman peaks is discussed.

Domaines

Matière Condensée [cond-mat] Physique [physics] Chimie

Ninel Kokanyan  : Connectez-vous pour contacter le contributeur

https://hal.science/hal-01760047

Soumis le : jeudi 5 avril 2018-23:55:32

Dernière modification le : mardi 12 septembre 2023-14:06:26

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Dates et versions

hal-01760047 , version 1 (05-04-2018)

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  • HAL Id : hal-01760047 , version 1

Citer

Narek Margaryan, Ninel Kokanyan, Edvard Kokanyan. The AFM and Raman Study of Few Layer Graphene . Nanotech Middle East 2017 International Conference, Dec 2017, Dubai, United Arab Emirates. ⟨hal-01760047⟩

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