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Article Dans Une Revue Energy Procedia Année : 2014

Study of Photoluminescence Decay by Time-correlated Single Photon Counting for the Determination of the Minority-carrier Lifetime in Silicon

Résumé

The minority-carrier lifetime is a crucial parameter for the improvement of electronic or optoelectronic materials and particularly solar cells. We have investigated the potential of the time-correlated single photon counting (TCSPC) for the measurement of time-resolved photoluminescence (TRPL) and the direct determination of the effective minority-carrier lifetime in silicon. The TRPL technique was found to be in very good agreement with quasi-steady state and transient photoconductance results obtained from Sinton Instruments and micro-wave photo- conductance from Semilab. We have demonstrated the ability to evaluate the effective carrier lifetime of silicon substrates over a broad range of values (between a few μs and less than 500 μs).

Dates et versions

hal-01758300 , version 1 (04-04-2018)

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Stéphanie Parola, Mehdi Daanoune, Alexandru Focsa, Bachir Semmache, Erwann Picard, et al.. Study of Photoluminescence Decay by Time-correlated Single Photon Counting for the Determination of the Minority-carrier Lifetime in Silicon. Energy Procedia, 2014, 55, pp.121 - 127. ⟨10.1016/j.egypro.2014.08.091⟩. ⟨hal-01758300⟩
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