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Communication Dans Un Congrès Année : 2015

Scanning acoustic microscopy and shear wave imaging mode performances for failure detection in high-density microassembling technologies

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Electronique
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hal-01719760 , version 1 (28-02-2018)

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Z. Remili, Y. Ousten, B. Levrier, E. Suhir, L. Bechou. Scanning acoustic microscopy and shear wave imaging mode performances for failure detection in high-density microassembling technologies. 2015 IEEE 65th Electronic Components and Technology Conference (ECTC), May 2015, San Diego, France. ⟨10.1109/ECTC.2015.7159891⟩. ⟨hal-01719760⟩
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