Extracting the temperature dependence of thermal resistance from temperature-controlled DC measurements of sige HBTs - Archive ouverte HAL Accéder directement au contenu
Communication Dans Un Congrès Année : 2017
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hal-01695326 , version 1 (29-01-2018)

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Suresh Balanethiram, Rosario d'Esposito, Sebastien Fregonese, Thomas Zimmer, Jorg Berkner, et al.. Extracting the temperature dependence of thermal resistance from temperature-controlled DC measurements of sige HBTs. 2017 IEEE Bipolar/BiCMOS Circuits and Technology Meeting (BCTM), Oct 2017, Miami, France. ⟨10.1109/BCTM.2017.8112919⟩. ⟨hal-01695326⟩
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