TCAD Simulation of the Single Event Effects in Normally-off GaN Transistors after Heavy Ion Radiation - Archive ouverte HAL Access content directly
Conference Papers Year : 2016

TCAD Simulation of the Single Event Effects in Normally-off GaN Transistors after Heavy Ion Radiation

Abstract

Electrical behavior of normally-off GaN power transistors under heavy ion stress radiation is presented based on 2D-TCAD numerical simulation in order to better understand the mechanism of Single Event Effects (SEE) in these devices.
Fichier principal
Vignette du fichier
Abstract_ZERARKA_RADECS -16.pdf (1.34 Mo) Télécharger le fichier
Origin : Files produced by the author(s)
Loading...

Dates and versions

hal-01692046 , version 2 (04-07-2017)
hal-01692046 , version 1 (24-01-2018)

Identifiers

Cite

Moustafa Zerarka, Patrick Austin, Alain Bensoussan, Frédéric Morancho, André Durier. TCAD Simulation of the Single Event Effects in Normally-off GaN Transistors after Heavy Ion Radiation. RADECS 2016 (RADiation Effects on Components and Systems), Sep 2016, Brême, Germany. 4p., ⟨10.1109/TNS.2017.2710629⟩. ⟨hal-01692046v2⟩
187 View
600 Download

Altmetric

Share

Gmail Facebook Twitter LinkedIn More