Backtracking Depth-Resolved Microstructures for Crystal Plasticity Identification—Part 2: Identification - Archive ouverte HAL
Article Dans Une Revue JOM Journal of the Minerals, Metals and Materials Society Année : 2017

Backtracking Depth-Resolved Microstructures for Crystal Plasticity Identification—Part 2: Identification

Résumé

The present study considers the identification of crystal plasticity parameters from the knowledge of a deformed microstructure, which has been backtracked to the reference state, and known kinematics along the sample surface. This theoretical question is tackled on a numerical (synthetic) test case. A 2D microstructure with one dimension along the depth is generated, and deformed using known crystal plasticity law. A procedure is proposed to perform the calibration of the constitutive parameters addressing the specific challenge of having a partial knowledge of the boundary conditions. The proposed identification strategy combined with the estimation of the reference microstructure is shown to retrieve the constitutive parameters with good accuracy.
Fichier principal
Vignette du fichier
JOM2017b-ccsd.pdf (1.83 Mo) Télécharger le fichier
Origine Fichiers produits par l'(les) auteur(s)
Loading...

Dates et versions

hal-01674541 , version 1 (03-01-2018)

Identifiants

Citer

Qiwei Shi, Félix Latourte, François Hild, Stéphane Roux. Backtracking Depth-Resolved Microstructures for Crystal Plasticity Identification—Part 2: Identification. JOM Journal of the Minerals, Metals and Materials Society, 2017, 69 (12), pp.2803 - 2809. ⟨10.1007/s11837-017-2586-1⟩. ⟨hal-01674541⟩
145 Consultations
129 Téléchargements

Altmetric

Partager

More