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Journal Articles Microelectronics Reliability Year : 2003

Degradation in polysilicon thin film transistors related to the quality of the polysilicon material

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Engineering Sciences [physics] Electronics

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https://hal.science/hal-01647861

Submitted on : Friday, November 24, 2017-4:04:52 PM

Last modification on : Wednesday, August 2, 2023-4:40:25 PM

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hal-01647861 , version 1 (24-11-2017)

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H. Toutah, B. Tala-Ighil, Jean-François Llibre, B. Boudart, T. Mohammed-Brahim, et al.. Degradation in polysilicon thin film transistors related to the quality of the polysilicon material. Microelectronics Reliability, 2003, 43 (9-11), pp.1531 - 1535. ⟨10.1016/S0026-2714(03)00271-3⟩. ⟨hal-01647861⟩

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