Behavior of Polysilicon Thin-Film Transistors at Different Temperatures - Archive ouverte HAL Access content directly
Journal Articles Solid State Phenomena Year : 2003
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hal-01647854 , version 1 (24-11-2017)

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Jean-François Llibre, H. Toutah, B. Tala-Ighil, B. Boudart, T. Mohammed-Brahim, et al.. Behavior of Polysilicon Thin-Film Transistors at Different Temperatures. Solid State Phenomena, 2003, 93, pp.67 - 72. ⟨10.4028/www.scientific.net/SSP.93.67⟩. ⟨hal-01647854⟩
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