Comparison of Single Event Transients Generated at Four Pulsed-Laser Test Facilities-NRL, IMS, EADS, JPL - Archive ouverte HAL Accéder directement au contenu
Article Dans Une Revue IEEE Transactions on Nuclear Science Année : 2012

Comparison of Single Event Transients Generated at Four Pulsed-Laser Test Facilities-NRL, IMS, EADS, JPL

Résumé

Single event transients generated in a large-area photodiode were compared using a variety of different pulsed laser systems. Differences in transient amplitudes and charge collection are attributed to the different laser characteristics.

Domaines

Electronique
Fichier non déposé

Dates et versions

hal-01633618 , version 1 (13-11-2017)

Identifiants

Citer

S. Buchner, Nicolas Jean-Henri Roche, J. Warner, D. Mcmorrow, F. Miller, et al.. Comparison of Single Event Transients Generated at Four Pulsed-Laser Test Facilities-NRL, IMS, EADS, JPL. IEEE Transactions on Nuclear Science, 2012, 59 (4), pp.988-998. ⟨10.1109/TNS.2012.2201956⟩. ⟨hal-01633618⟩
198 Consultations
0 Téléchargements

Altmetric

Partager

Gmail Facebook X LinkedIn More