Probe Characterization for Electromagnetic Near-Field Studies - Archive ouverte HAL Access content directly
Journal Articles IEEE Transactions on Instrumentation and Measurement Year : 2010
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hal-01632350 , version 1 (10-11-2017)

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Sylvie Jarrix, Tristan Dubois, D. Gasquet, P. Nouvel, R. Adam, et al.. Probe Characterization for Electromagnetic Near-Field Studies. IEEE Transactions on Instrumentation and Measurement, 2010, 59 (2), pp.292 - 300. ⟨10.1109/TIM.2009.2023148⟩. ⟨hal-01632350⟩
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