Review and Analysis of the Radiation-Induced Degradation Observed for the Input Bias Current of Linear Integrated Circuits - Archive ouverte HAL Accéder directement au contenu
Article Dans Une Revue IEEE Transactions on Nuclear Science Année : 2008

Review and Analysis of the Radiation-Induced Degradation Observed for the Input Bias Current of Linear Integrated Circuits

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Electronique
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hal-01630081 , version 1 (07-11-2017)

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Laurent Dusseau, Muriel Bernard, Jérôme Boch, Yago Gonzalez Velo, Nicolas Roche, et al.. Review and Analysis of the Radiation-Induced Degradation Observed for the Input Bias Current of Linear Integrated Circuits. IEEE Transactions on Nuclear Science, 2008, 55 (6), pp.3174 - 3181. ⟨10.1109/TNS.2008.2006835⟩. ⟨hal-01630081⟩
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