Multi-MGy Total Ionizing Dose Induced MOSFET Variability Effects on Radiation Hardened CMOS Image Sensor Performances
Serena Rizzolo
(1)
,
Vincent Goiffon
(1)
,
Marius Sergent
(1)
,
F. Corbiere
(1)
,
Sébastien Rolando
(1)
,
Aziouz Chabane
(1)
,
Philippe Paillet
(2)
,
Claude Marcandella
(2)
,
Sylvain Girard
(3)
,
Pierre Magnan
(1)
,
Marco van Uffelen
(4)
,
Laura Mont-Casellas
(4)
,
Robin Scott
(5)
,
Wouter de Cock
(6)
Serena Rizzolo
- Function : Author
- PersonId : 1382640
- ORCID : 0000-0003-3784-0831
- IdRef : 226777979
Philippe Paillet
- Function : Author
- PersonId : 1223287
- ORCID : 0000-0001-8701-7283
- IdRef : 156234165
Sylvain Girard
- Function : Author
- PersonId : 4880
- IdHAL : sylvain-girard-ujm
- ORCID : 0000-0002-9804-8971
- IdRef : 076444899