Allocation for Testability in High-Level Synthesis Process - Archive ouverte HAL
Communication Dans Un Congrès Année : 1998

Allocation for Testability in High-Level Synthesis Process

Résumé

This paper focuses on the allocation for testability process as part of a High-Level Synthesis for Testability system. The allocation for testability is mainly defined as the search for best cost/quality trade-offs between the designer requirements and testability means that can be proposed by the system, considering the available functional units in a library and the possibility to generate additional testability structures.
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Dates et versions

hal-01618367 , version 1 (17-10-2017)

Identifiants

  • HAL Id : hal-01618367 , version 1

Citer

Peter Bukovjan, Meryem Marzouki, Walid Maroufi. Allocation for Testability in High-Level Synthesis Process. 5th Electronic Devices and Systems Conference, Jun 1998, Brno, Czech Republic. ⟨hal-01618367⟩
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