Nonlinear properties of Ge-rich SiGe waveguides (Orale)
Abstract
We report the first third order nonlinear characterization of Ge-rich Si 1-x Ge x waveguides, with Germanium concentrations ranging from 0.7 to 0.9. A bi-directional top hat D-Scan method was used to determine the waveguide nonlinear parameters and to deduce the Kerr nonlinear refractive index and the two-photon absorption coefficient at the wavelength of 1.58 µm.
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