A new approach to the modelling of Kelvin Probe Microscopy of heterostructures in dark and under illumination
Résumé
A numerical method is proposed to model Kelvin Probe Force Microscopy (KPFM) of heterostructures in the dark and under illumination. It is applied FTO/TiO2 and FTO/TiO2MAPbI3 structures.
Origine | Fichiers produits par l'(les) auteur(s) |
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