Metallization of warm dense SiO$_2$ studied by XANES spectroscopy - Archive ouverte HAL
Article Dans Une Revue Physical Review Letters Année : 2014

Metallization of warm dense SiO$_2$ studied by XANES spectroscopy

Résumé

We investigate the evolution of the electronic structure of fused silica in a dense plasma regime using time-resolved x-ray absorption spectroscopy. We use a nanosecond (ns) laser beam to generate a strong uniform shock wave in the sample and a picosecond (ps) pulse to produce a broadband x-ray source near the Si $K$ edge. By varying the delay between the two laser beams and the intensity of the ns beam, we explore a large thermodynamical domain with densities varying from 1 to 5 g/cm$^3$ and temperatures up to 5 eV. In contrast to normal conditions where silica is a well-known insulator with a wide band gap of 8.9 eV, we find that shocked silica exhibits a pseudogap as a semimetal throughout this thermodynamical domain. This is in quantitative agreement with density functional theory predictions performed using the generalized gradient approximation.
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hal-01561842 , version 1 (12-01-2022)

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A. Denoeud, A. Benuzzi-Mounaix, A. Ravasio, F. Dorchies, P. M. Leguay, et al.. Metallization of warm dense SiO$_2$ studied by XANES spectroscopy. Physical Review Letters, 2014, 113 (11), pp.116404. ⟨10.1103/PhysRevLett.113.116404⟩. ⟨hal-01561842⟩
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