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Communication Dans Un Congrès Année : 2012

Electro-thermal characterization of a differential temperature sensor and the thermal coupling in a 65nm CMOS IC

Résumé

This paper explains the design decisions and the different measurements we have done in order to characterize the thermal coupling and the characteristics of temperature sensors embedded in a integrated circuit implemented in a CMOS 65nm technology. The circuit contains a 2GHz linear power amplifier, MOS transistors behaving as heat sources and two differential temperature sensors. Temperature measurements performed with the embedded sensor are corroborated with an Infra-Red camera and a laser interferometer used as thermometer. © 2012 CMP.
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Dates et versions

hal-01555439 , version 1 (04-07-2017)

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  • HAL Id : hal-01555439 , version 1

Citer

J. Altet, J. L. Gonzalez, D. Gomez, X. Perpiñà, Stéphane Grauby, et al.. Electro-thermal characterization of a differential temperature sensor and the thermal coupling in a 65nm CMOS IC. 18th International Workshop on Thermal Investigations of ICs and Systems (THERMINIC), 2012, Sep 2012, Budapest, Hungary. pp.61-66. ⟨hal-01555439⟩
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