Characterization of the thermal behavior of PN thermoelectric couples by scanning thermal microscope - Archive ouverte HAL
Article Dans Une Revue Microelectronics Journal Année : 2004

Characterization of the thermal behavior of PN thermoelectric couples by scanning thermal microscope

Résumé

In this paper, we present the temperature profile measurements of a PN thermoelectric couple. The study is made in the AC regime. A couple is fed by a sinusoidal current and, using a scanning thermal microscope (SThM) and a lock-in scheme, we measure the amplitude and the phase of the first harmonic of the temperature along the surface of the couple. The influence of frequency is observed and we present a model which predicts the thermal behavior of the couple. The results of this model are in excellent agreement with the measurements.

Dates et versions

hal-01550876 , version 1 (29-06-2017)

Identifiants

Citer

L. D. P. Lopez, Stéphane Grauby, S. Dilhaire, M. A. Salhi, W. Claeys, et al.. Characterization of the thermal behavior of PN thermoelectric couples by scanning thermal microscope. Microelectronics Journal, 2004, 35 (10), pp.797-803. ⟨10.1016/j.mejo.2004.06.010⟩. ⟨hal-01550876⟩
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