<?xml version="1.0" encoding="utf-8"?>
<TEI xmlns="http://www.tei-c.org/ns/1.0" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" xmlns:hal="http://hal.archives-ouvertes.fr/" xmlns:gml="http://www.opengis.net/gml/3.3/" xmlns:gmlce="http://www.opengis.net/gml/3.3/ce" version="1.1" xsi:schemaLocation="http://www.tei-c.org/ns/1.0 http://api.archives-ouvertes.fr/documents/aofr-sword.xsd">
  <teiHeader>
    <fileDesc>
      <titleStmt>
        <title>HAL TEI export of hal-01550429</title>
      </titleStmt>
      <publicationStmt>
        <distributor>CCSD</distributor>
        <availability status="restricted">
          <licence target="https://creativecommons.org/publicdomain/zero/1.0/">CC0 1.0 - Universal</licence>
        </availability>
        <date when="2026-05-20T02:50:07+02:00"/>
      </publicationStmt>
      <sourceDesc>
        <p part="N">HAL API Platform</p>
      </sourceDesc>
    </fileDesc>
  </teiHeader>
  <text>
    <body>
      <listBibl>
        <biblFull>
          <titleStmt>
            <title xml:lang="en">Fault localisation in ICs by goniometric laser probing of thermal induced surface waves</title>
            <author role="aut">
              <persName>
                <forename type="first">S.</forename>
                <surname>Dilhaire</surname>
              </persName>
              <email type="md5">6cd0859157003fc730d32612f9b6960e</email>
              <email type="domain">u-bordeaux.fr</email>
              <idno type="idhal" notation="string">stefandilhaire</idno>
              <idno type="idhal" notation="numeric">20652</idno>
              <idno type="halauthorid" notation="string">180743-20652</idno>
              <idno type="IDREF">https://www.idref.fr/09855946X</idno>
              <affiliation ref="#struct-773"/>
            </author>
            <author role="aut">
              <persName>
                <forename type="first">J.</forename>
                <surname>Altet</surname>
              </persName>
              <idno type="halauthorid">244152-0</idno>
              <affiliation ref="#struct-51015"/>
            </author>
            <author role="aut">
              <persName>
                <forename type="first">S.</forename>
                <surname>Jorez</surname>
              </persName>
              <idno type="halauthorid">1190004-0</idno>
              <affiliation ref="#struct-773"/>
            </author>
            <author role="aut">
              <persName>
                <forename type="first">Emmanuel</forename>
                <surname>Schaub</surname>
              </persName>
              <email type="md5">ba18c827b4b7cc9511bdfd330f8bc412</email>
              <email type="domain">univ-rennes1.fr</email>
              <idno type="idhal" notation="string">emmanuel-schaub</idno>
              <idno type="idhal" notation="numeric">3108</idno>
              <idno type="halauthorid" notation="string">13151-3108</idno>
              <affiliation ref="#struct-773"/>
            </author>
            <author role="aut">
              <persName>
                <forename type="first">A.</forename>
                <surname>Rubio</surname>
              </persName>
              <idno type="halauthorid">147072-0</idno>
              <affiliation ref="#struct-51015"/>
            </author>
            <author role="aut">
              <persName>
                <forename type="first">W.</forename>
                <surname>Claeys</surname>
              </persName>
              <idno type="halauthorid">180745-0</idno>
              <affiliation ref="#struct-773"/>
            </author>
            <editor role="depositor">
              <persName>
                <forename>Bernadette</forename>
                <surname>Bergeret</surname>
              </persName>
              <email type="md5">7cbfe0077c772b3e771109a5fcb2cabc</email>
              <email type="domain">orange.fr</email>
            </editor>
          </titleStmt>
          <editionStmt>
            <edition n="v1" type="current">
              <date type="whenSubmitted">2017-06-29 15:24:55</date>
              <date type="whenModified">2024-04-09 08:56:04</date>
              <date type="whenReleased">2017-06-29 15:24:55</date>
              <date type="whenProduced">1999-06</date>
              <ref type="externalLink" target="https://api.istex.fr/ark:/67375/6H6-K5ZBC4HL-5/fulltext.pdf?sid=hal"/>
            </edition>
            <respStmt>
              <resp>contributor</resp>
              <name key="108218">
                <persName>
                  <forename>Bernadette</forename>
                  <surname>Bergeret</surname>
                </persName>
                <email type="md5">7cbfe0077c772b3e771109a5fcb2cabc</email>
                <email type="domain">orange.fr</email>
              </name>
            </respStmt>
          </editionStmt>
          <publicationStmt>
            <distributor>CCSD</distributor>
            <idno type="halId">hal-01550429</idno>
            <idno type="halUri">https://hal.science/hal-01550429</idno>
            <idno type="halBibtex">dilhaire:hal-01550429</idno>
            <idno type="halRefHtml">&lt;i&gt;Microelectronics Reliability&lt;/i&gt;, 1999, 39 (6-7), pp.919-923. &lt;a target="_blank" href="https://dx.doi.org/10.1016/S0026-2714(99)00123-7"&gt;&amp;#x27E8;10.1016/S0026-2714(99)00123-7&amp;#x27E9;&lt;/a&gt;</idno>
            <idno type="halRef">Microelectronics Reliability, 1999, 39 (6-7), pp.919-923. &amp;#x27E8;10.1016/S0026-2714(99)00123-7&amp;#x27E9;</idno>
            <availability status="restricted"/>
          </publicationStmt>
          <seriesStmt>
            <idno type="stamp" n="CNRS">CNRS - Centre national de la recherche scientifique</idno>
            <idno type="stamp" n="LOMA">Laboratoire Ondes et Matière d'Aquitaine</idno>
          </seriesStmt>
          <notesStmt>
            <note type="audience" n="2">International</note>
            <note type="popular" n="0">No</note>
            <note type="peer" n="1">Yes</note>
          </notesStmt>
          <sourceDesc>
            <biblStruct>
              <analytic>
                <title xml:lang="en">Fault localisation in ICs by goniometric laser probing of thermal induced surface waves</title>
                <author role="aut">
                  <persName>
                    <forename type="first">S.</forename>
                    <surname>Dilhaire</surname>
                  </persName>
                  <email type="md5">6cd0859157003fc730d32612f9b6960e</email>
                  <email type="domain">u-bordeaux.fr</email>
                  <idno type="idhal" notation="string">stefandilhaire</idno>
                  <idno type="idhal" notation="numeric">20652</idno>
                  <idno type="halauthorid" notation="string">180743-20652</idno>
                  <idno type="IDREF">https://www.idref.fr/09855946X</idno>
                  <affiliation ref="#struct-773"/>
                </author>
                <author role="aut">
                  <persName>
                    <forename type="first">J.</forename>
                    <surname>Altet</surname>
                  </persName>
                  <idno type="halauthorid">244152-0</idno>
                  <affiliation ref="#struct-51015"/>
                </author>
                <author role="aut">
                  <persName>
                    <forename type="first">S.</forename>
                    <surname>Jorez</surname>
                  </persName>
                  <idno type="halauthorid">1190004-0</idno>
                  <affiliation ref="#struct-773"/>
                </author>
                <author role="aut">
                  <persName>
                    <forename type="first">Emmanuel</forename>
                    <surname>Schaub</surname>
                  </persName>
                  <email type="md5">ba18c827b4b7cc9511bdfd330f8bc412</email>
                  <email type="domain">univ-rennes1.fr</email>
                  <idno type="idhal" notation="string">emmanuel-schaub</idno>
                  <idno type="idhal" notation="numeric">3108</idno>
                  <idno type="halauthorid" notation="string">13151-3108</idno>
                  <affiliation ref="#struct-773"/>
                </author>
                <author role="aut">
                  <persName>
                    <forename type="first">A.</forename>
                    <surname>Rubio</surname>
                  </persName>
                  <idno type="halauthorid">147072-0</idno>
                  <affiliation ref="#struct-51015"/>
                </author>
                <author role="aut">
                  <persName>
                    <forename type="first">W.</forename>
                    <surname>Claeys</surname>
                  </persName>
                  <idno type="halauthorid">180745-0</idno>
                  <affiliation ref="#struct-773"/>
                </author>
              </analytic>
              <monogr>
                <idno type="halJournalId" status="VALID">17084</idno>
                <idno type="issn">0026-2714</idno>
                <idno type="eissn">1872-941X</idno>
                <title level="j">Microelectronics Reliability</title>
                <imprint>
                  <publisher>Elsevier</publisher>
                  <biblScope unit="volume">39</biblScope>
                  <biblScope unit="issue">6-7</biblScope>
                  <biblScope unit="pp">919-923</biblScope>
                  <date type="datePub">1999-06</date>
                </imprint>
              </monogr>
              <idno type="doi">10.1016/S0026-2714(99)00123-7</idno>
            </biblStruct>
          </sourceDesc>
          <profileDesc>
            <langUsage>
              <language ident="en">English</language>
            </langUsage>
            <textClass>
              <classCode scheme="halDomain" n="phys">Physics [physics]</classCode>
              <classCode scheme="halTypology" n="ART">Journal articles</classCode>
              <classCode scheme="halOldTypology" n="ART">Journal articles</classCode>
              <classCode scheme="halTreeTypology" n="ART">Journal articles</classCode>
            </textClass>
            <abstract xml:lang="en">
              <p>New methods for fault detection in ICs are needed due to new technological trends. The detection of heat generated by faults offers interesting perspectives in this respect. Periodic heat released at the surface or inside ICs generates a surface thermal wave that can be detected by appropriate laser probing at distances up to 500 μm from the source. We propose in this paper a goniometric laser probing method allowing the determination of the direction and distance of a fault with respect to the probing point.</p>
            </abstract>
          </profileDesc>
        </biblFull>
      </listBibl>
    </body>
    <back>
      <listOrg type="structures">
        <org type="laboratory" xml:id="struct-773" status="OLD">
          <orgName>Centre de physique moléculaire optique et hertzienne</orgName>
          <orgName type="acronym">CPMOH</orgName>
          <date type="start">1978-01-01</date>
          <date type="end">2010-12-31</date>
          <desc>
            <address>
              <addrLine>Bât. Recherche Physique 351, Cours de la Libération 33405 TALENCE CEDEX</addrLine>
              <country key="FR"/>
            </address>
            <ref type="url">http://www.cpmoh.cnrs.fr</ref>
          </desc>
          <listRelation>
            <relation active="#struct-92972" type="direct"/>
            <relation name="UMR5798" active="#struct-441569" type="direct"/>
          </listRelation>
        </org>
        <org type="laboratory" xml:id="struct-51015" status="VALID">
          <orgName>Department of Electronic Engineering</orgName>
          <desc>
            <address>
              <country key="ES"/>
            </address>
          </desc>
          <listRelation>
            <relation active="#struct-85878" type="direct"/>
          </listRelation>
        </org>
        <org type="institution" xml:id="struct-92972" status="VALID">
          <orgName>Université Sciences et Technologies - Bordeaux 1</orgName>
          <orgName type="acronym">UB</orgName>
          <date type="start">1971-01-01</date>
          <date type="end">2013-12-31</date>
          <desc>
            <address>
              <addrLine>351 cours de la Libération - 33405 Talence.</addrLine>
              <country key="FR"/>
            </address>
            <ref type="url">http://www.u-bordeaux1.fr</ref>
          </desc>
        </org>
        <org type="regroupinstitution" xml:id="struct-441569" status="VALID">
          <idno type="IdRef">02636817X</idno>
          <idno type="ISNI">0000000122597504</idno>
          <idno type="ROR">https://ror.org/02feahw73</idno>
          <orgName>Centre National de la Recherche Scientifique</orgName>
          <orgName type="acronym">CNRS</orgName>
          <date type="start">1939-10-19</date>
          <desc>
            <address>
              <country key="FR"/>
            </address>
            <ref type="url">https://www.cnrs.fr/</ref>
          </desc>
        </org>
        <org type="regroupinstitution" xml:id="struct-85878" status="VALID">
          <idno type="ROR">https://ror.org/03mb6wj31</idno>
          <orgName>Universitat Politècnica de Catalunya =  Université polytechnique de Catalogne = Polytechnic University of Catalunya [Barcelona]</orgName>
          <orgName type="acronym">UPC</orgName>
          <desc>
            <address>
              <addrLine>C./Jordi Girona, 1-3, 08034 Barcelona</addrLine>
              <country key="ES"/>
            </address>
            <ref type="url">https://www.upc.edu/ca</ref>
          </desc>
        </org>
      </listOrg>
    </back>
  </text>
</TEI>