Oscillation of the cantilever in atomic force microscopy: Probing the sample response at the microsecond scale - Archive ouverte HAL Access content directly
Journal Articles Journal of Applied Physics Year : 1997

Oscillation of the cantilever in atomic force microscopy: Probing the sample response at the microsecond scale

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hal-01550169 , version 1 (29-06-2017)

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  • HAL Id : hal-01550169 , version 1

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T. Bouhacina, D. Michel, J. P. Aime, S. Gauthier. Oscillation of the cantilever in atomic force microscopy: Probing the sample response at the microsecond scale. Journal of Applied Physics, 1997, 82 (8), pp.3652-3660. ⟨hal-01550169⟩

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