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Journal Articles EPJ Web of Conferences Year : 2010

X-ray strain analysis in thin films enhanced by 2D detection

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hal-01537638 , version 1 (12-06-2017)

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G. Geandier, D. Faurie, P. Renault, Christophe Le Bourlot, P. Djemia, et al.. X-ray strain analysis in thin films enhanced by 2D detection. EPJ Web of Conferences, 2010, 6, ⟨10.1051/epjconf/20100626008⟩. ⟨hal-01537638⟩
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