X-rays preconditioning effects on the induced refractive index change in femtosecond laser fabrication of embedded waveguides in silica glasses - Archive ouverte HAL Accéder directement au contenu
Communication Dans Un Congrès Année : 2016

X-rays preconditioning effects on the induced refractive index change in femtosecond laser fabrication of embedded waveguides in silica glasses

Emmanuel Marin
Sylvain Girard
Aziz Boukenter
Youcef Ouerdane
Razvan Stoian

Résumé

The fs-laser induced modification of the refractive index was investigated for pure fused silica (Corning 7980) under X-ray preconditioning (20-100 keV). Three samples have been pre-irradiated with different accumulated doses of 0.5 MGy (SiO2), 1 MGy, 6 MGy and one kept as a reference. Waveguides have been inscribed in all these samples varying the pulse energy and scan speed. The X-ray treatment influence on the refractive index change (∆n) was investigated through the estimation of the numerical aperture (NA) of the written waveguides. Results show that ∆n is higher in the pre-irradiated samples with Xrays compared with the untreated one. As a consequence, the photoinscription efficiency increases and the pretreatment can be considered as an option for high contrast low loss index modifications.
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Dates et versions

hal-01528234 , version 1 (28-05-2017)

Identifiants

  • HAL Id : hal-01528234 , version 1

Citer

Maxime Royon, Emmanuel Marin, Sylvain Girard, Aziz Boukenter, Youcef Ouerdane, et al.. X-rays preconditioning effects on the induced refractive index change in femtosecond laser fabrication of embedded waveguides in silica glasses . 11th International Symposium on SiO2, Advanced Dielectrics and Related Devices, Jun 2016, Nice, France. pp.29-30. ⟨hal-01528234⟩
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