Radiation Hardening of Digital Color CMOS Camera-on-a-Chip Building Blocks for Multi-MGy Total Ionizing Dose Environments - Archive ouverte HAL
Communication Dans Un Congrès Année : 2016

Radiation Hardening of Digital Color CMOS Camera-on-a-Chip Building Blocks for Multi-MGy Total Ionizing Dose Environments

Résumé

The TID hardness of digital color CMOS camera-on-a-chip building blocks (radiation hardened pixel array, color filter arrays and radiation hardened column ADCs) is demonstrated in the multi-MGy range using Co-60 irradiations
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Dates et versions

hal-01528219 , version 1 (28-05-2017)

Identifiants

  • HAL Id : hal-01528219 , version 1

Citer

Vincent Goiffon, Franck Corbière, Sébastien Rolando, Jeremy Baer, Aziouz Chabane, et al.. Radiation Hardening of Digital Color CMOS Camera-on-a-Chip Building Blocks for Multi-MGy Total Ionizing Dose Environments. 2016 IEEE Nuclear and Space Radiation Effects Conference (NSREC 2016), Jul 2016, Portland, United States. ⟨hal-01528219⟩
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