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Communication Dans Un Congrès Année : 2016
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hal-01474797 , version 1 (23-02-2017)

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A. Benhassain, F. Cacho, V. Huard, Lorena Anghel. Early failure prediction by using in-situ monitors: Implementation and application results. Workshop on Early Reliability Modeling for Aging and Variability in Silicon Systems, Mar 2016, Dresden, Germany. ⟨hal-01474797⟩

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