Novel Wideband Eddy Current Device for the Conductivity Measurement of Semiconductors - Archive ouverte HAL
Article Dans Une Revue IEEE Sensors Journal Année : 2016

Novel Wideband Eddy Current Device for the Conductivity Measurement of Semiconductors

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hal-01465306 , version 1 (11-02-2017)

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Florent Loete, Yann Le Bihan, Denis Mencaraglia. Novel Wideband Eddy Current Device for the Conductivity Measurement of Semiconductors. IEEE Sensors Journal, 2016, 16 (11), pp.4151-4152. ⟨10.1109/JSEN.2016.2544403⟩. ⟨hal-01465306⟩
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