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Article Dans Une Revue Thin Solid Films Année : 2016

In situ X-ray diffraction studies on the piezoelectric response of PZT thin films

A. Davydok
  • Fonction : Auteur
C. Mocuta
E. C. Lima
  • Fonction : Auteur
E. B. Araujo
  • Fonction : Auteur

Résumé

Piezoelectric properties of randomly oriented self-polarized PbZr0.50Ti0.50O3 (PZT) thin films were investigated using in situ synchrotron X-ray diffraction. Possibilities for investigating the piezoelectric effect using microsized hard X-ray beams are demonstrated and perspectives for future dynamical measurements on PZT samples with variety of compositions and thicknesses are given. Studies performed on the crystalline [100, 110] directions evidenced piezoelectric anisotropy. The piezoelectric coefficient d(33) was calculated in terms of the lab reference frame (d(perp)) and found to be two times larger along the [100] direction than along the [110] direction. The absolute values for the d(perp) amount to 120 and 230 pm/V being in good agreement with experimental and theoretical values found in literature for bulk PZT ceramics. (C) 2016 Elsevier B.V. All rights reserved.

Dates et versions

hal-01435127 , version 1 (13-01-2017)

Identifiants

Citer

A. Davydok, T. W. Cornelius, C. Mocuta, E. C. Lima, E. B. Araujo, et al.. In situ X-ray diffraction studies on the piezoelectric response of PZT thin films. Thin Solid Films, 2016, 603, pp.29-33. ⟨10.1016/j.tsf.2016.01.045⟩. ⟨hal-01435127⟩
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